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Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
 

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Article DOI: 10.3791/55232-v • 11:30 min • March 6th, 2017
March 6th, 2017 •
1,2, 3, 4, 1,2
1ARC Centre of Excellence in Exciton Science, 2School of Physics, University of New South Wales, 3CSIRO, CSIRO Energy Centre, 4School of Chemistry, University of New South Wales

Kapitel

Summary
Automatic Translation

A Time Resolved Microwave Conductivity technique for investigating direct and trap-mediated recombination dynamics and determining carrier mobilities of thin film semiconductors is presented here.

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Recombination Dynamics Thin-film Photovoltaic Materials Time-resolved Microwave Conductivity Photo-induced Charge Carriers Trap States Band-to-band Recombination Processes Reflected Microwave Power Electrical Contacts Measured Lifetimes Conductivities Cathodes Measurement Sample Thin-film Perovskite Sample Microwave Cavity Network Analyzer Laser Custom Microwave Cavity Quarter-wave Plates Iris Fiber Port Teflon Sample Holder Defuser Tuning Screw Off-axis Parabolic Mirror Coupler Neutral-density Filters
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