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Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel
Journal JoVE
Neurosciences
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Journal JoVE Neurosciences
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
DOI:

08:57 min

July 06, 2011

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Chapitres

  • 00:05Titre
  • 01:29Sample Fixation and Resin Embedding
  • 04:00Preparing the Sample for the FIB/SEM
  • 05:55Imaging the FIB/SEM
  • 08:03Results: FIB/SEM Images of Brain Tissue
  • 08:40Conclusion

Summary

Traduction automatique

Dit protocol beschrijft hoe hars ingebed hersenweefsel kan worden voorbereid en afgebeeld in de drie dimensies in de gerichte ion beam, scanning electronen microscoop.

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