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Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)
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Journal JoVE Bio-ingénierie
Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)

Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)

DOI:
10.3791/4133-v

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09:14 min

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October 02, 2012

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, , ,
1Hochschule Aalen,Institut für Angewandte Forschung

Chapitres

  • 00:05Titre
  • 01:40Seeding and Incubation of Cells
  • 02:47VA-TIRFM
  • 05:26Data Analysis
  • 06:45Results: Calculation of Cell-substrate Distances in Glioblastoma Cells
  • 08:32Conclusion

Summary

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Topology of cell adhesion on a substrate is measured with nanometre precision by variable-angle total internal reflection fluorescence microscopy (VA-TIRFM).

Tags

NanotopologyCell AdhesionVariable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)Surface TopologySubstrateNanometer PrecisionTransparent SlidesFluorescent MarkerPlasma MembraneIlluminationLaser BeamTotal Internal Reflection (TIR)Evanescent Electromagnetic FieldFluorescence ImagesCell-substrate DistancesAdhesion DifferencesCell LinesCancer CellsMalignant CellsChemical TreatmentPhotodynamic TreatmentSuper-resolution Microscopy

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