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Implementation of a Reference Interferometer for Nanodetection
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Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

DOI:
10.3791/51133-v

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16:11 min

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April 26, 2014

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, ,
1Department of Electrical and Computer Engineering,University of Victoria

Chapitres

  • 00:00Titre
  • 01:36Reference Interferometer Construction
  • 03:01Free Spectral Range Measurement
  • 03:57Fiber Pulling
  • 06:46Preparation and Delivery of Solutions
  • 12:43System Configuration and Interconnections
  • 14:06Nanoparticle Detection
  • 14:45Post-processing of Data
  • 15:32Conclusion

Summary

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A reference interferometer technique, which is designed to remove undesirable laser jitter noise for nanodetection, is utilized for probing an ultra-high quality factor microcavity. Instructions for assembly, setup, and data acquisition are provided, alongside the measurement process for specifying the cavity quality factor.

Tags

Reference InterferometerNanodetectionFiber InterferometerMicrocavityFree Spectral RangeFiber TaperLaser Jitter NoisePolystyrene NanobeadsAdaptive Curve FittingQuality FactorResonant WavelengthSplit Frequency ShiftsBinding Events

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