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Writing and Low-Temperature Characterization of Oxide Nanostructures
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Ingénierie
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Journal JoVE Ingénierie
Writing and Low-Temperature Characterization of Oxide Nanostructures

Writing and Low-Temperature Characterization of Oxide Nanostructures

DOI:
10.3791/51886-v

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06:43 min

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July 18, 2014

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, , , , , , ,
1Department of Physics,University of Pittsburgh

Chapitres

  • 00:00Titre
  • 00:13Obtain LaAlO3/SrTiO3 nanostructures
  • 00:29Photolithographic processing of sample
  • 02:04Wire bond a canvas to prepare for nanowriting
  • 02:47Write nanostructures
  • 04:31Cool device and take measurements
  • 06:22Conclusion

Summary

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Oxide nanostructures provide new opportunities for science and technology. The interfacial conductivity between LaAlO3 and SrTiO3 can be controlled with near-atomic precision using a conductive atomic force microscopy technique. The protocol for creating and measuring conductive nanostructures at LaAlO3/SrTiO3 interfaces is demonstrated.

Tags

Keywords: Oxide NanoelectronicsLaAlO3/SrTiO3 NanostructuresConductive Atomic Force MicroscopyNanolithographyTransport MeasurementsLow-temperature Characterization

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