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Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model
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Journal JoVE Ingénierie
Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model

Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model

DOI:
10.3791/53026-v

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06:54 min

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August 22, 2015

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,
1Department of Applied Physics,Eindhoven University of Technology, 2Dutch Institute for Fundamental Energy Research

Chapitres

  • 00:05Titre
  • 01:13Raman Spectroscopy of Nanocrystals
  • 04:01Determining the Size Distribution of the Nanocrystals
  • 05:38Results: Raman Spectroscopy Accurately Measures Particle Size
  • 06:35Conclusion

Summary

Traduction automatique

Traduction automatique

We demonstrate how to determine the size distribution of semiconductor nanocrystals in a quantitative manner using Raman spectroscopy employing an analytically defined multi-particle phonon confinement model. Results obtained are in excellent agreement with the other size analysis techniques like transmission electron microscopy and photoluminescence spectroscopy.

Tags

Nanocrystal Size DistributionRaman SpectroscopyMulti-particle Phonon Confinement ModelSemiconductor NanocrystalsSize-dependent Phonon ConfinementNon-destructive Size AnalysisSilicon NanocrystalsTransmission Electron MicroscopyX-ray DiffractionPhotoluminescence Spectroscopy

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