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A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Journal JoVE
Ingénierie
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Journal JoVE Ingénierie
A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
DOI:

07:15 min

June 02, 2017

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Chapitres

  • 00:05Titre
  • 00:45Microfabrication of Silicon Frames
  • 02:13Laser Patterning of Metal Copper Specimens
  • 03:38Microdevice-based Electromechanical Testing Systems (MEMTS) Assembly
  • 04:38In Situ Transmission Electron Microscopy (TEM) Experiments
  • 05:52Results: In Situ Electromechanical Characterization of a Single-crystal Copper Specimen
  • 06:50Conclusion

Summary

Traduction automatique

Isolating electrical and thermal effects on electrically assisted deformation (EAD) is very difficult using macroscopic samples. Metallic sample micro- and nanostructures together with a custom test procedure have been developed to evaluate the impact of applied current on the formation without joule heating and evolution of dislocations on these samples.

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