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Chapitres
- 00:04Introduction
- 00:59Transmission Electron Microscopy (TEM) Alignment for Beam-Rocking
- 02:36Incident Beam Collimation and Pivot Point Setup
- 03:47Electron-Channeling Pattern (ECP) Acquisition
- 04:30Energy-Dispersive X-Ray Analysis
- 05:10Results: Representative ECP and ICP Emission Imaging
- 06:46Conclusion
Tags
Keywords:
Quantitative AnalysisAtomic-siteFunctional DopantsPoint DefectsCrystalline MaterialsElectron-channeling-enhanced MicroanalysisEnergy-dispersive X-ray SpectroscopyElectron Energy-loss SpectroscopyLattice DefectsVacanciesInterstitialsGrain BoundariesTransmission Electron MicroscopySTEMOptical Axis AlignmentBeam RockingCaustic SpotCondenser Aperture
