Journal
/
/
Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
Journal JoVE
Ingénierie
Author Produced
Un abonnement à JoVE est nécessaire pour voir ce contenu.  Connectez-vous ou commencez votre essai gratuit.
Journal JoVE Ingénierie
Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
DOI:

07:42 min

July 20, 2022

, , , ,

Chapitres

  • 00:04Introduction
  • 01:00MFM Probe Preparation and Installation
  • 02:35Sample Preparation, Installation, and Sample Approach
  • 03:27Topography Imaging
  • 04:33MFM Imaging
  • 06:23Results: MFM Imaging of Magnetic Twin Boundaries in a Single Crystal Ni-Mn-Ga Sample
  • 06:58Conclusion

Summary

Traduction automatique

Magnetic force microscopy (MFM) employs a vertically magnetized atomic force microscopy probe to measure sample topography and local magnetic field strength with nanoscale resolution. Optimizing MFM spatial resolution and sensitivity requires balancing decreasing lift height against increasing drive (oscillation) amplitude, and benefits from operating in an inert atmosphere glovebox.

Vidéos Connexes

Read Article