Max-Planck-Institut für Eisenforschung GmbH View Institution's Website 1 article published in JoVE Engineering Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries Oana Cojocaru-Mirédin1, Torsten Schwarz1, Pyuck-Pa Choi1, Michael Herbig1, Roland Wuerz2, Dierk Raabe1 1Department of Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, 2Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg ( ZSW ) In this work, we describe the use of the atom-probe tomography technique for studying the grain boundaries of the absorber layer in a CIGS solar cell. A novel approach to prepare the atom probe tips containing the desired grain boundary with a known structure is also presented here.