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扫描探针单电子电容谱

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Scanning-probe Single-electron Capacitance Spectroscopy

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扫描探针单电子电容谱

DOI:

10.3791/50676-v

•

10:53 min

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July 30, 2013

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Kathleen A. Walsh, Megan E. Romanowich, Morewell Gasseller², Irma Kuljanishvili³, Raymond Ashoori, Stuart Tessmer

¹Department of Physics and Astronomy,Michigan State University, ²Department of Chemistry & Biochemistry/Physics,Mercyhurst University, ³Department of Physics,Saint Louis University, ⁴Department of Physics,Massachusetts Institute of Technology

Capitoli

00:05Titolo
01:57Microscope Setup, Preparation, and Mounting of the High Electron Mobility Transistor Circuit
06:37Capacitance Mode Measurements
08:05Results: Scanning Charge Accumulation and Capacitance-voltage Spectroscopy of Doped Semiconductors
10:17Conclusion

Summary

Traduzione automatica

扫描探针单电子电容谱有利于在本地化的地下区域的单电子运动的研究。一个敏感的低温扫描探针显微镜研究半导体样品的表面下方的小系统的掺杂原子电荷检测电路纳入。

Tags

Scanning-probe Single-electron Capacitance Spectroscopy Electronic Quantum Structure Subsurface Charge Accumulation (SCA) Imaging Spatial Resolution Charge Resolution HEMT Cryogenic Temperatures

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