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Capitoli
- 00:05Titolo
- 02:13Mounting of COOH-SAM Surfaces on Gold for Soft Landing of Mass-selected Ions
- 03:07Soft Landing of Mass-selected Ru(bpy)32+ onto COOH-SAM Surfaces
- 04:17Analysis by In Situ TOF-SIMS Before and After Exposure to Reactive Gases
- 05:59Analysis by In Situ FT-ICR-SIMS and IRRAS During and After Soft Landing
- 07:28Results: Characterization of Organometallic Ions Soft Landed onto COOH-SAMs by In Situ SIMS and IR Spectroscopy
- 09:39Conclusion
Blød landing af masse-udvalgte ioner på overflader er en kraftfuld metode til den meget kontrollerede udarbejdelse af nye materialer. Kombineret med analyse af in situ sekundær ion massespektrometri (SIMS) og infrarød refleksion absorption spektroskopi (IRRAS), blød landing giver hidtil usete indsigt i samspillet mellem veldefinerede arter med overflader.
Tags
Keywords: Soft LandingMass-selected IonsIn Situ CharacterizationSecondary Ion Mass Spectrometry (SIMS)Infrared Reflection Absorption Spectroscopy (IRRAS)OrganometallicsSelf-assembled MonolayersRuthenium Tris(bipyridine) DicationsTime-of-flight (TOF)-SIMSFourier Transform Ion Cyclotron Resonance (FT-ICR)-SIMS
