In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

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Cited by 4

10:22 min

June 16th, 2014

10.3791/51344-v

June 16th, 2014

17.3K views

Soft landing of mass-selected ions onto surfaces is a powerful approach for the highly-controlled preparation of novel materials. Coupled with analysis by in situ secondary ion mass spectrometry (SIMS) and infrared reflection absorption spectroscopy (IRRAS), soft landing provides unprecedented insights into the interactions of well-defined species with surfaces.

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Soft Landing

Chapters in this video

0:05

Title

2:13

Mounting of COOH-SAM Surfaces on Gold for Soft Landing of Mass-selected Ions

3:07

Soft Landing of Mass-selected Ru(bpy)32+ onto COOH-SAM Surfaces

4:17

Analysis by In Situ TOF-SIMS Before and After Exposure to Reactive Gases

5:59

Analysis by In Situ FT-ICR-SIMS and IRRAS During and After Soft Landing

7:28

Results: Characterization of Organometallic Ions Soft Landed onto COOH-SAMs by In Situ SIMS and IR Spectroscopy

9:39

Conclusion

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