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利用飞行时二次离子质谱法成像金属颜料界面的腐蚀
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Chimica
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JoVE Journal Chimica
Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
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利用飞行时二次离子质谱法成像金属颜料界面的腐蚀

DOI:
10.3791/59523-v

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07:24 min

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May 06, 2019

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, , ,
1Earth and Biological Sciences Directorate,Pacific Northwest National Laboratory, 2Energy and Environment Directorate,Pacific Northwest National Laboratory, 3Wiley Environmental Molecular Sciences Laboratory,Pacific Northwest National Laboratory

Capitoli

  • 00:04Titolo
  • 00:55Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Analysis of the Metal-Paint Corrosion Interface
  • 05:32Results: Comparison of Corroded and Non-Corroded Aluminum-Paint Interfaces
  • 06:16Conclusion

Summary

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与暴露在空气中的试样相比, 采用飞行时间二次离子质谱法, 在铝合金的金属漆界面上进行化学映射和腐蚀形态。

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