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微谐振器中孤子晶体的快速重复率波动测量

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Rapid Repetition Rate Fluctuation Measurement of Soliton Crystals in a Microresonator

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微谐振器中孤子晶体的快速重复率波动测量

DOI:

10.3791/60689-v

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07:42 min

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December 15, 2021

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Peng Xie*^1,2, Xinyu Wang*^1,2, Weiqiang Wang², Wenfu Zhang², Zhizhou Lu², Yang Wang², Wei Zhao²

¹State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics (XIOPM),Chinese Academy of Sciences (CAS), ²University of Chinese Academy of Sciences

Capitoli

00:04Introduction
01:09Optical Coupling
02:19Device Packaging
02:56SCs (Soliton Crystals) Generation
04:52Repetition Rate Fluctuation Measurement
06:13Results: Perfect SC and SC with a Single Vacancy
07:03Conclusion

Summary

Traduzione automatica

在这里，我们提出了一种使用热调谐方法在蝴蝶封装的微环谐振器中产生孤子晶体的协议。此外，使用延迟自外差法测量具有单个空位的孤子晶体的重复速率波动。

Tags

Keywords: Soliton Crystals Microresonator Repetition Rate Fluctuation Packaging Chip-scale Dissipative Kerr Soliton UV Adhesive Thermal Electric Cooler Erbium Doped Fiber Amplifier Polarization Control

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