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Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
 

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Article DOI: 10.3791/61955-v • 11:03 min • July 14th, 2022
July 14th, 2022 •
1, 1, 1,2
1School of Applied and Engineering Physics, Cornell University, 2Kavli Institute at Cornell for Nanoscale Science

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Cryogenic Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) techniques can provide key insights into the chemistry and morphology of intact solid-liquid interfaces. Methods for preparing high quality Energy Dispersive X-ray (EDX) spectroscopic maps of such interfaces are detailed, with a focus on energy storage devices.

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Nanoscale Characterization Liquid-solid Interfaces Cryo-focused Ion Beam Milling Scanning Electron Microscopy Spectroscopy Cryo-SEM FIB Method Solid-liquid Interfaces Biological Samples Native Structure Macroscopic Devices Coin Cell Battery Electrodes Nanometers Resolution Cryo-SEM Stage Anticontaminator SEM Chamber Gas Injection System GIS Platinum Source Sample Surface GIS Temperature Shutter Evacuation Period Microscope Stage Prep Stages Anticontaminator Temperature Vitrify The Sample Nitrogen Dual-pot Slusher
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