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Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
JoVE Journal
Biologia
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JoVE Journal Biologia
Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
DOI:

05:34 min

June 30, 2023

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Capitoli

  • 00:04Introduction
  • 00:31Bacterial Sample Preparation and AFM Measurements
  • 03:10Results: Atomic Force Contact Microscopic Analysis of Bacterial Cultures Under Nanoparticle Influence
  • 04:46Conclusion

Summary

Traduzione automatica

Here, we present the application of atomic force microscopy (AFM) as a simple and fast method for bacterial characterization and analyze details such as the bacterial size and shape, bacterial culture biofilms, and the activity of nanoparticles as bactericides.

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