JoVE Journal > Engineering
Summary
Abstract
Introduction
Protocol
Results
Discussion
Disclosures
Acknowledgements
Materials
References
자동 번역
공학

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mekaniske egenskabsmålinger på nanoskala i luft og væske

Published: December 02, 2022
doi:
10.3791/64497
, , , , , , , , , , ,
1Micron School of Materials Science & Engineering,Boise State University, 2Department of Mechanical & Biomedical Engineering,Boise State University, 3Department of Physics,Boise State University, 4Energy and Environmental Science and Technology,Idaho National Laboratory, 5Science and Technology,Idaho National Laboratory, 6Harold Hamm School of Geology & Geological Engineering,University of North Dakota, 7Biomolecular Sciences Graduate Program,Boise State University, 8Center for Advanced Energy Studies

Summary

Kvantificering af kontaktområdet og kraften, der påføres af et atomkraftmikroskop (AFM) sondespids på en prøveoverflade, muliggør bestemmelse af mekaniske egenskaber i nanoskala. Bedste praksis for implementering af AFM-udkragningsbaseret nanoindrykning i luft eller væske på bløde og hårde prøver til måling af elastisk modul eller andre nanomekaniske egenskaber diskuteres.

Abstract

Et atomkraftmikroskop (AFM) måler fundamentalt interaktionen mellem en nanoskala AFM-sondespids og prøveoverfladen. Hvis den kraft, der påføres af sondespidsen og dens kontaktområde med prøven, kan kvantificeres, er det muligt at bestemme nanoskalaens mekaniske egenskaber (f.eks. elastik eller Youngs modul) af overfladen, der undersøges. En detaljeret procedure til udførelse af kvantitative AFM cantilever-baserede nanoindrykningseksperimenter gives her med repræsentative eksempler på, hvordan teknikken kan anvendes til at bestemme de elastiske moduli af en lang række prøvetyper, lige fra kPa til GPa. Disse omfatter levende mesenkymale stamceller (MSC’er) og kerner i fysiologisk buffer, harpiksindlejrede dehydrerede loblolly fyrretræstværsnit og Bakken-skifer af varierende sammensætning.

Derudover anvendes AFM-udkragningsbaseret nanoindrykning til at undersøge brudstyrken (dvs. gennembrudskraften) af phospholipid-dobbeltlag. Vigtige praktiske overvejelser såsom metodevalg og udvikling, sondevalg og kalibrering, identifikation af interesseområde, prøveheterogenitet, funktionsstørrelse og billedformat, spidsslid, overfladeruhed og dataanalyse og målestatistikker diskuteres for at hjælpe med korrekt implementering af teknikken. Endelig demonstreres samlokalisering af AFM-afledte nanomekaniske kort med elektronmikroskopiteknikker, der giver yderligere information om elementær sammensætning.

Introduction

Forståelse af materialers mekaniske egenskaber er en af de mest grundlæggende og væsentlige opgaver inden for teknik. Til analyse af bulkmaterialeegenskaber er der adskillige metoder til rådighed til at karakterisere de mekaniske egenskaber ved materialesystemer, herunder træktest1, kompressionstest2 og tre- eller firepunkts bøjningstest (bøjning)3. Mens disse mikroskalatest kan give uvurderlig information om bulkmaterialeegenskaber, udføres de generelt til fiasko og er derfor destruktive. Derudover mangler de den rumlige opløsning, der er nødvendig for nøjagtigt at undersøge mikro- og nanoskalaegenskaberne for mange materialesystemer, der er af interesse i dag, såsom tyndfilm, biologiske materialer og nanokompositter. For at begynde at løse nogle af problemerne med storskala mekanisk testning, hovedsageligt dens destruktive karakter, blev mikrohårdhedstest vedtaget fra mineralogi. Hårdhed er et mål for et materiales modstand mod plastisk deformation under specifikke forhold. Generelt bruger mikrohardhedstest en stiv sonde, normalt lavet af hærdet stål eller diamant, til at indrykke i et materiale. Den resulterende indrykningsdybde og / eller areal kan derefter bruges til at bestemme hårdheden. Flere metoder er blevet udviklet, herunder Vickers4, Knoop5 og Brinell6 hårdhed; Hver giver et mål for mikroskala materialehårdhed, men under forskellige betingelser og definitioner, og producerer som sådan kun data, der kan sammenlignes med test udført under de samme betingelser.

Instrumenteret nanoindrykning blev udviklet for at forbedre de relative værdier opnået via de forskellige mikrohårdhedstestmetoder, forbedre den rumlige opløsning, der er mulig til analyse af mekaniske egenskaber, og muliggøre analyse af tynde film. Det er vigtigt, at ved at bruge metoden, der først blev udviklet af Oliver og Pharr7, kan elastikken eller Youngs modul, E, af et prøvemateriale bestemmes via instrumenteret nanoindrykning. Ved at anvende en Berkovich tresidet pyramideformet nanoindentersonde (hvis ideelle spidsområdefunktion matcher Vickers firesidede pyramidesonde)8, kan der desuden foretages direkte sammenligning mellem nanoskala og mere traditionelle mikroskala hårdhedsmålinger. Med AFM’s voksende popularitet begyndte AFM-udkragningsbaseret nanoindrykning også at få opmærksomhed, især til måling af blødere materialers mekaniske egenskaber. Som et resultat, som vist skematisk i figur 1, er de to mest almindeligt anvendte teknikker i dag til at forhøre og kvantificere mekaniske egenskaber i nanoskala instrumenteret nanoindrykning (figur 1A) og AFM-udkragningsbaseret nanoindrykning (figur 1B)9, hvoraf sidstnævnte er fokus for dette arbejde.

Figure 1
Figur 1: Sammenligning af instrumenterede og AFM-udkragningsbaserede nanoindrykningssystemer. Skematiske diagrammer, der viser typiske systemer til udførelse af (A) instrumenteret nanoindrykning og (B) AFM-udkragningsbaseret nanoindrykning. Dette tal blev ændret fra Qian et al.51. Forkortelse: AFM = atomkraftmikroskopi. Klik her for at se en større version af denne figur.

Både instrumenteret og AFM-udkragningsbaseret nanoindrykning anvender en stiv sonde til at deformere en prøveoverflade af interesse og overvåge den resulterende kraft og forskydning som en funktion af tiden. Typisk specificeres enten den ønskede belastnings- (dvs. kraft) eller (Z-piezo) forskydningsprofil af brugeren via softwaregrænsefladen og styres direkte af instrumentet, mens den anden parameter måles. Den mekaniske egenskab, der oftest opnås ved nanoindrykningseksperimenter, er det elastiske modul (E), også kaldet Youngs modul, som har trykenheder. Et materiales elastiske modul er en grundlæggende egenskab i forbindelse med bindingsstivheden og defineres som forholdet mellem træk- eller trykspænding (σ, den påførte kraft pr. arealenhed) og aksial belastning (ε, den proportionale deformation langs indrykningsaksen) under elastisk (dvs. reversibel eller midlertidig) deformation før plastisk deformation (ligning [1]):

Equation 1(1)

Det skal bemærkes, at fordi mange materialer (især biologiske væv) faktisk er viskoelastiske, består det (dynamiske eller komplekse) modul i virkeligheden af både elastiske (opbevaring, i fase) og viskøse (tab, ud af fase) komponenter. I praksis er det, der måles i et nanoindrykningseksperiment, det reducerede modul, E *, som er relateret til det sande prøvemodul af interesse, E, som vist i ligning (2):

Equation 2(2)

Hvor E-spids og ν-spids er henholdsvis det elastiske modul og Poissons forhold mellem nanoindenterspidsen, og ν er det estimerede Poissons forhold mellem prøven. Poissons forhold er det negative forhold mellem den tværgående og aksiale stamme og angiver derfor graden af tværgående forlængelse af en prøve, når den udsættes for aksial belastning (f.eks. under nanoindrykningsbelastning), som vist i ligning (3):

Equation 3(3)

Omdannelsen fra reduceret til faktisk modul er nødvendig, fordi a) noget af den aksiale belastning, der tilføres af indenterspidsen, kan omdannes til tværgående belastning (dvs. prøven kan deformeres via ekspansion eller sammentrækning vinkelret på belastningsretningen), og b) indenterspidsen ikke er uendelig hård, og således resulterer handlingen med at indrykke prøven i en vis (lille) deformation af spidsen. Bemærk, at i det tilfælde, hvor E-spidsen >> E (dvs. indenterspidsen er meget hårdere end prøven, hvilket ofte er sandt, når man bruger en diamantsonde), forenkles forholdet mellem det reducerede og faktiske prøvemodul meget til E ≈ E * (1 – v2). Mens instrumenteret nanoindrykning er overlegen med hensyn til nøjagtig kraftkarakterisering og dynamisk område, er AFM-udkragningsbaseret nanoindrykning hurtigere, giver størrelsesordener større kraft og forskydningsfølsomhed, muliggør billeddannelse med højere opløsning og forbedret indrykningslokalisering og kan samtidig undersøge magnetiske og elektriske egenskaber i nanoskala9. Især er AFM-udkragningsbaseret nanoindrykning overlegen til kvantificering af mekaniske egenskaber på nanoskala af bløde materialer (f.eks. polymerer, geler, lipiddobbeltlag og celler eller andre biologiske materialer), ekstremt tynde (sub-μm) film (hvor substrateffekter kan komme i spil afhængigt af indrykningsdybde)10,11 og suspenderede todimensionelle (2D) materialer12,13,14 såsom grafen 15,16, glimmer17, sekskantet bornitrid (h-BN)18 eller overgangsmetaldichalcogenider (TMDC’er; f.eks. MoS2)19. Dette skyldes dets udsøgte kraft (sub-nN) og forskydning (sub-nm) følsomhed, hvilket er vigtigt for nøjagtigt at bestemme det oprindelige kontaktpunkt og forblive inden for det elastiske deformationsområde.

I AFM-udkragningsbaseret nanoindrykning aktiveres forskydningen af en AFM-sonde mod prøveoverfladen af et kalibreret piezoelektrisk element (figur 1B), hvor den fleksible udkragning til sidst bøjes på grund af den resistive kraft, der opleves ved kontakt med prøveoverfladen. Denne bøjning eller afbøjning af udkragningen overvåges typisk ved at reflektere en laser fra bagsiden af udkragningen og ind i en fotodetektor (positionsfølsom detektor [PSD]). Sammen med kendskabet til udkragningsstivheden (i nN/nm) og afbøjningsfølsomheden (i nm/V) er det muligt at konvertere denne målte udkragningsafbøjning (i V) til den kraft (i nN), der påføres prøven. Efter kontakt giver forskellen mellem Z-piezo-bevægelsen og udkragningsudbøjningen prøveindrykningsdybden. Kombineret med kendskabet til tipområdets funktion muliggør dette beregning af tipprøvekontaktområdet. Hældningen af de kontaktende dele af de resulterende kraft-distance eller kraftforskydningskurver (F-D) kan derefter tilpasses ved hjælp af en passende kontaktmekanikmodel (se afsnittet Dataanalyse i diskussionen) for at bestemme prøvens nanomekaniske egenskaber. Mens AFM-udkragningsbaseret nanoindrykning har nogle klare fordele i forhold til instrumenteret nanoindrykning som beskrevet ovenfor, præsenterer den også flere praktiske implementeringsudfordringer, såsom kalibrering, spidsslid og dataanalyse, som vil blive diskuteret her. En anden potentiel ulempe ved AFM-udkragningsbaseret nanoindrykning er antagelsen om lineær elasticitet, da kontaktradius og indrykningsdybder skal være meget mindre end indenterradius, hvilket kan være vanskeligt at opnå, når man arbejder med nanoskala AFM-sonder og / eller prøver, der udviser betydelig overfladeruhed.

Traditionelt har nanoindrykning været begrænset til individuelle placeringer eller små gitterindrykningseksperimenter, hvor en ønsket placering (dvs. interesseområde [ROI]) vælges, og et enkelt kontrolleret indryk, flere indrykninger på et enkelt sted adskilt af en vis ventetid og / eller et groft gitter af indrykninger udføres med en hastighed i størrelsesordenen Hz. Imidlertid giver de seneste fremskridt inden for AFM mulighed for samtidig erhvervelse af mekaniske egenskaber og topografi gennem anvendelse af højhastighedskraftkurvebaserede billeddannelsestilstande (omtalt af forskellige handelsnavne afhængigt af systemproducenten), hvor kraftkurver udføres med en kHz hastighed under belastningskontrol, med den maksimale tipprøvekraft anvendt som billeddannelsessætpunkt. Point-and-shoot-metoder er også blevet udviklet, hvilket giver mulighed for erhvervelse af et AFM-topografibillede efterfulgt af efterfølgende selektiv nanoindrykning på interessepunkter i billedet, hvilket giver rumlig kontrol i nanoskala over nanoindrykningsplacering. Selvom det ikke er det primære fokus for dette arbejde, præsenteres specifikke udvalgte applikationseksempler på både kraftkurvebaseret billeddannelse og peg-og-skyd-cantilever-baseret nanoindrykning i de repræsentative resultater og kan bruges sammen med protokollen skitseret nedenfor, hvis den er tilgængelig på den særlige anvendte AFM-platform. Specifikt skitserer dette arbejde en generaliseret protokol til praktisk implementering af AFM-cantilever-baseret nanoindrykning på ethvert kapabelt AFM-system og giver fire eksempler på brugssager (to i luft, to i væske) af teknikken, herunder repræsentative resultater og en grundig diskussion af nuancer, udfordringer og vigtige overvejelser for at kunne anvende teknikken med succes.

Protocol

BEMÆRK: På grund af den brede vifte af kommercielt tilgængelige AFM’er og mangfoldigheden af prøvetyper og applikationer, der findes til cantilever-baseret nanoindrykning, er den følgende protokol bevidst designet til at være relativt generel og fokusere på de fælles trin, der er nødvendige for alle cantilever-baserede nanoindrykningseksperimenter uanset instrument eller producent. På grund af dette antager forfatterne, at læseren i det mindste har grundlæggende fortrolighed med at betjene det specifikke inst…

Representative Results

KraftforskydningskurverFigur 7 viser repræsentative, næsten ideelle F-D-kurver opnået fra nanoindrykningseksperimenter udført i luft på harpiksindlejrede loblolly fyrretræsprøver (figur 7A) og i væske (fosfatbufret saltvand [PBS]) på mesenkymale stamcellekerner (MSC) (figur 7B). Brugen af enhver kontaktmekanikmodel afhænger af den nøjagtige og pålidelige bestemmelse af det indledende tip-prøvekontak…

Discussion

Forberedelse af prøver
For nanoindrykning i luft omfatter almindelige forberedelsesmetoder kryosektionering (f.eks. vævsprøver), slibning og/eller polering efterfulgt af ultramikrotoming (f.eks. harpiksindlejrede biologiske prøver), ionfræsning eller fokuseret ionstråleforberedelse (f.eks. halvleder-, porøse eller blandede hårdhedsprøver, der ikke kan poleres), mekanisk eller elektrokemisk polering (f.eks. metallegeringer) eller tyndfilmsaflejring (f.eks. atomlag eller kemisk dampaflejring, …

Disclosures

The authors have nothing to disclose.

Acknowledgements

Alle AFM-eksperimenter blev udført i Boise State University Surface Science Laboratory (SSL). SEM-karakterisering blev udført i Boise State Center for Materials Characterization (BSCMC). Forskning rapporteret i denne publikation vedrørende biobrændstofråmaterialer blev delvist støttet af US Department of Energy, Office of Energy Efficiency and Renewable Energy, Bioenergy Technologies Office som en del af Feedstock Conversion Interface Consortium (FCIC) og under DOE Idaho Operations Office Contract DE-AC07-051ID14517. Cellemekanikundersøgelser blev støttet af National Institutes of Health (USA) under tilskud AG059923, AR075803 og P20GM109095 og af National Science Foundation (USA) tilskud 1929188 og 2025505. Arbejdet med lipid-dobbeltlagssystemer blev støttet af National Institutes of Health (USA) under tilskud R01 EY030067. Forfatterne takker Dr. Elton Graugnard for at producere det sammensatte billede vist i figur 11.

Materials

Atomic force microscope Bruker Dimension Icon Uses Nanoscope control software, including PeakForce Quantitative Nanomechanical Mapping (PF-QNM), FastForce Volume (FFV), and Point-and-Shoot Ramping experimental workspaces
AtomicJ American Institute of Physics https://doi.org/10.1063/1.4881683 Flexible, powerful, free open source Java-based force curve analysis software package. Supports numerous contact mechanic models, such as Hertz, Sneddon DMT, JKR, Maugis, and cone or pyramid (including blunt and truncated). Also includes a variety of initial contact point estimation methods to choose from. Supports batch processing of data and subsequent statistical analysis (e.g., averages, standard deviations, histograms, goodness of fit, etc.). Literature citation is: P. Hermanowicz, M. Sarna, K. Burda, and H. GabryEquation 1, “AtomicJ: An open source software for analysis of force curves” Rev. Sci. Instrum. 85: 063703 (2014), https://doi.org/10.1063/1.4881683
Buffer solution (PBS) Fisher Chemical (NaCl), Sigma Aldrich (KCl), Fisher BioReagents (Na2HPO4 and KH2PO4) S271 (>99% purity NaCl), P9541 (>99% purity KCl), BP332(>99% purity Na2HPO4), BP362 (>99% purity KH2PO4) Phosphate buffered saline (PBS) was prepared in the laboratory as an aqueous solution consisting of 137 mM NaCl, 2.7 mM KCl, 10 mM Na2HPO4, and 1.8 mM KH2PO4 dissolved in ultrapure water. Reagents were measured out using an analytical balance, and glassware was cleaned with soap and water followed by autoclaving immediately prior to use.
Chloroform
Diamond tip AFM probe Bruker PDNISP Pre-mounted factory-calibrated cube corner diamond (E = 1140 GPa) tip AFM probe (nominal R = 40 nm) with a stainless steel cantilever (nominal k = 225 N/m, f0 = 50 kHz). Spring constant is measured at the factory (k = 256 N/m for the probe, Serial #13435414, used here) and calibration data (including AFM images of indents showing probe geometry) is provided with the probe.
Diamond ultramicrotome blade Diatome Ultra 35° 2.1 mm width. Also used a standard glass blade for intial rough cut of sample surface before transitioning to diamond blade for final surface preparation
Epoxy Gorilla Glue 26853-31-6 Epoxy resin and hardner were mixed in a 1:1 ratio, a small drop was placed on a stainless steel sample puck (Ted Pella), and V1 grade muscovite mica (Ted Pella) was attached to create an atomically flat surface for preparation of phospholipid membranes.
Ethanol
LR white resin, medium grade (catalyzed) Electron Microscopy Sciences 14381 500 mL bottle, Lot #150629
Mesenchymal stem cells (MSCs) N/A N/A MSCs for nanomechanical studies were primary cells harvested from 8-10 week old male C57BL/6 mice as described in Goelzer, M. et al. "Lamin A/C Is Dispensable to Mechanical Repression of Adipogenesis" Int J Mol Sci 22: 6580 (2021) doi:10.3390/ijms22126580 and Peister, A. et al. "Adult stem cells from bone marrow (MSCs) isolated from different strains of inbred mice vary in surface epitopes, rates of proliferation, and differentiation potential" Blood 103: 1662-1668 (2004), doi:10.1182/blood-2003-09-3070.
Modulus standards Bruker PFQNM-SMPKIT-12M Used HOPG (E = 18 GPa) and PS (E = 2.7 GPa). Also contains 2x PDMS (Tack 0, E = 2.5 MPa; Tack 4, E = 3.5 MPa), PS-LDPE (E = 2.0/0.2 GPa), fused silica (E = 72.9 GPa), sapphire (E – 345 GPa), and tip characterization (titanium roughness) sample. All samples come pre-mounted on a 12 mm diameter steel disc (sample puck).
Muscovite mica Ted Pella 50-12 12 mm diameter, V1 grade muscovite mica
Nanscope Analysis Bruker Version 2.0 Free AFM image processing and analysis software package, but designed for, and proprietary/limited to Bruker AFMs; similar functionality is available from free, platform-independent AFM image processing and analysis software packages such as Gwyddion, WSxM, and others. Has built-in capabilities for force curve analysis, but AtomicJ is more flexible/full featured (e.g., more built-in contact mechanics models to choose from, statistical analysis of force curve fitting results, etc.) for force curve analysis and handles batch processing of force curves.
Phospholipids: POPC, Cholesterol (ovine) Avanti Polar Lipids POPC: CAS # 26853-31-6, Cholesterol: CAS # 57-88-5 POPC lipid dissolved in chloroform (25 mg/mL) was obtained from vendor and used without further purification. Cholesterol powder from the same vendor was dissolved in chloroform (20 mg/mL). 
Probe holder (fluid, lipid bilayers) Bruker MTFML-V2 Specific to the particular AFM used; MTFML-V2 is a glass probe holder for scanning in fluid on a MultiMode AFM.
Probe holder (fluid, MSCs) Bruker FastScan Bio Z-scanner Used with Dimension FastScan head (XY flexure scanners). Serial number MXYPOM5-1B154.
Probe holder (standard, ambient) Bruker DAFMCH Specific to the particular AFM used; DAFMCH is the standard contact and tapping mode probe holder for the Dimension Icon AFM, suitable for nanoindentation (PF-QNM, FFV, and point-and-shoot ramping)
Sample Puck Ted Pella 16218 Product number is for 15 mm diameter stainless steel sample puck. Also available in 6 mm, 10 mm, 12 mm, and 20 mm diameters at https://www.tedpella.com/AFM_html/AFM.aspx#anchor842459
Sapphire substrate Bruker PFQNM-SMPKIT-12M Extremely hard surface (E = 345 GPa) for measuring deflection sensitivity of probes (want all of the deflection to come from the probe, not the substrate). Part of the PF-QNM/modulus standards kit.
Scanning electron microscope Hitachi S-3400N-II Located at Boise State. Used to perform co-localized SEM/EDS on all samples except additively manufactured (AM) Ti-6Al-4V.
Silicon AFM probes (standard) NuNano Scout 350 Standard tapping mode silicon probe with reflective aluminum backside coating; k = 42 N/m (nominal), f0 = 350 kHz. Nominal R = 5 nm. Also available uncoated or with reflective gold backside coating. Probes with similar specifications are available from other manufacturers (e.g., Bruker TESPA-V2).
Silicon AFM probes (stiff) Bruker RTESPA-525, RTESPA-525-30  Rotated tip etched silicon probes with reflective aluminum backside coating; k = 200 N/m (nominal), f0 = 525 kHz. Nominal R = 8 nm for RTESPA-525, R = 30 nm for RTESPA-525-30. Spring constant of each RTESPA-525-30 is measured individually at the factory via laser Doppler vibrometry and supplied with the probe.
Silicon carbide grit paper (abrasive discs) Allied 50-10005 120 grit
Silicon nitride AFM probes (soft, large radius hemispherical tip) Bruker MLCT-SPH-5UM, MLCT-SPH-5UM-DC Also MLCT-SPH-1UM-DC. New product line of factory-calibrated (probe radius and spring constants of all cantilevers) large radius (R = 1 or 5 mm) hemispherical tip (at the end of a 23 mm long cylindrical shaft) probes. DC = drift compensation coating. 6 cantilevers/probe (A-F). Nominal spring constants: A, k = 0.07 N/m; B, k = 0.02 N/m; C, k = 0.01 N/m; D, k = 0.03 N/m; E, k = 0.1 N/m; F, k = 0.6 N/m.
Silicon nitride AFM probes (soft, medium sharp tip) Bruker DNP 4 cantilevers/probe (A-d). Nominal spring constants: A, k = 0.35 N/m; B, k = 0.12 N/m; C, k = 0.24 N/m; D, k = 0.06 N/m. Nominal radii of curvature, R = 10 nm.
Silicon nitride AFM probes (soft, sharp tip) Bruker ScanAsyst-Air Nominal values: resonance frequency, f0 = 70 kHz; spring constant, k = 0.4 N/m; radius of curvature, R = 2 nm. Designed for force curve based AFM imaging.
Superglue Henkel Loctite 495 Cyanoacrylate based instant adhesive. Lots of roughly equivalent products are readily available.
Syringe pump New Era Pump Systems NE1000US One channel syringe pump system with infusion and withdrawal capacity
Tip characterization standard Bruker PFQNM-SMPKIT-12M Titanium (Ti) roughness standard. Part of the PF-QNM/modulus standards kit.
Ultrahigh purity nitrogen (UHP N2), 99.999% Norco SPG TUHPNI – T T size compressed gas cylinder of ultrahigh purity (99.999%) nitrogen for drying samples
Ultramicrotome Leica EM UC6 Equipped with a glass blade (standard, for intial sample preparation) and a diamond blade (for final preparation)
Ultrapure water Thermo Fisher Barnstead Nanopure Model 7146 Model has been discontinued, but equivalent products are available. Produces ≥18.2 MΩ*cm ultrapure water with 1-5 ppb TOC (total organic content), per inline UV monitoring. Includes 0.2 µm particulate filter, ion exchange columns, and UV oxidation chamber.
Variable Speed Grinder Buehler EcoMet 3000 Used with silicon carbide grit papers during hand polishing.
Vibration isolation table (active) Herzan TS-140 Used with Bruker MultiMode AFM. Sits on a TMC 65-531 vibration isolation table. Bruker Dimension Icon AFM utilizes strictly passive vibration isolation (comes from manufacturer with custom acoustic hood, air table, and granite slab).
Vibration isolation table (passive) TMC 65-531 35" x 30" vibration isolation table with optional air damping (disabled). Used with Bruker MultiMode AFM. Herzan TS-140 "Table Stable" active vibration control table is located on top.
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Atomic Force MicroscopyAFMCantilever-based NanoindentationNanoscaleMechanical PropertiesModulusAirFluidTopographical ImagingQuantitative MeasurementsCalibrationProbeForceDisplacementDeflection Sensitivity
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Enrriques, A. E., Howard, S., Timsina, R., Khadka, N. K., Hoover, A. N., Ray, A. E., Ding, L., Onwumelu, C., Nordeng, S., Mainali, L., Uzer, G., Davis, P. H. Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid. J. Vis. Exp. (190), e64497, doi:10.3791/64497 (2022).
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