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Nanotopology van Celadhesie op variabele-Angle Total Internal Reflection fluorescentie microscopie (VA-TIRFM)
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Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)
DOI:

09:14 min

October 02, 2012

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Chapters

  • 00:05Title
  • 01:40Seeding and Incubation of Cells
  • 02:47VA-TIRFM
  • 05:26Data Analysis
  • 06:45Results: Calculation of Cell-substrate Distances in Glioblastoma Cells
  • 08:32Conclusion

Summary

자동 번역

Topologie van celhechting op een substraat wordt gemeten met nanometer precisie door variabele hoek totale interne reflectie fluorescentiemicroscopie (VA-TIRFM).

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