Journal
/
공학
/
Ohmsk Kontakt Fabrication Ved hjælp af en Fokuseret-ion Beam Teknik og elektrisk karakterisering for Layer Semiconductor nanostrukturer
JoVE 신문
공학
JoVE 비디오를 활용하시려면 도서관을 통한 기관 구독이 필요합니다.  전체 비디오를 보시려면 로그인하거나 무료 트라이얼을 시작하세요.
JoVE 신문 공학
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Ohmsk Kontakt Fabrication Ved hjælp af en Fokuseret-ion Beam Teknik og elektrisk karakterisering for Layer Semiconductor nanostrukturer

DOI:
10.3791/53200-v

•

08:12 min

•

December 05, 2015

•

, , ,
1Graduate Institute of Applied Science and Technology,National Taiwan University of Science and Technology, 2Department of Electronic Engineering,National Taiwan University of Science and Technology

Chapters

  • 00:05Title
  • 00:57Exfoliation of MoSe2 Layer Nanocrystals
  • 02:01Dispersion of the Layer Nanocrystals onto the Device Template
  • 02:42Electrode Fabrication by Focused-ion Beam
  • 06:14Results: Characteristics of Ohmic Contacts
  • 07:33Conclusion

Summary

자동 번역

자동 번역

We describe the approaches for the device fabrication and electrical characterization of molybdenum diselenide (MoSe2) layer semiconductor nanostructures with different thicknesses. In addition, the fabrication of ohmic contacts for MoSe2-layer nanocrystals by the focused-ion beam deposition method using platinum (Pt) as a contact metal is described.

Tags

Keywords: Ohmic ContactFocused-ion BeamLayer SemiconductorMoSe2Electrical CharacterizationThickness-dependent ConductivitySurface-dominant TransportTwo-dimensional Materials

Article

Embed

플레이리스트에 추가

Usage Statistics

Related Videos

check_url/kr/53200?article_type=v

Design, fremstilling, and Experimental karakterisering af plasmoniske Photoconductive Terahertz Emitters
check_url/kr/53200?article_type=v

Fremstilling og karakterisering af Disordered Polymer Optiske fibre til Tværgående Anderson lokalisering Light
check_url/kr/53200?article_type=v

Skrivning og lav temperatur Karakterisering af Oxide nanostrukturer
check_url/kr/53200?article_type=v

Mønster via optisk mættede Transitions - fremstilling og karakterisering
check_url/kr/53200?article_type=v

Fabrikation og Drift af et Nano-Optical transportbånd
check_url/kr/53200?article_type=v

Silicium-oxid-halvleder Quantum Dots for Single-elektron Pumpning
check_url/kr/53200?article_type=v

Fase Diagram Karakterisering Brug magnetiske perler som flydende bærestoffer
check_url/kr/53200?article_type=v

Omfattende karakterisering af Extended Fejl i Semiconductor Materials af en Scanning Electron Microscope
check_url/kr/53200?article_type=v

Fokuseret Ion Beam fabrikation af LiPON-baseret Solid-state Lithium-ion Nanobatteries til In Situ test
check_url/kr/53200?article_type=v

Atmosfærisk tryk fabrikation af store lag rektangulære SnSe flager

Read Article