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Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
JoVE 신문
공학
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JoVE 신문 공학
Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
DOI:

10:21 min

July 26, 2016

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Chapters

  • 00:05Title
  • 00:36System Setup
  • 03:21EFPA System Initialization and Optical Alignment
  • 04:39Total Internal Reflection Photoacoustic Spectroscopy (TIRPAS) Technique
  • 06:10Photoacoustic Spectrometry/Total Internal Reflection Photoacoustic Spectroscopy (PAS/TIRPAS) Refractometry
  • 07:40Optical Tunneling Photoacoustic Spectroscopy (OTPAS)
  • 08:43Results: Representative Data from TIRPAS, PAS/TIRPAS, and OTPAS Techniques
  • 09:53Conclusion

Summary

자동 번역

Here we present a protocol to estimate material and surface optical properties using the photoacoustic effect combined with total internal reflection. This technique evanescent field-based photoacoustics can be used to create a photoacoustic metrology system to estimate materials' thicknesses, bulk and thin film refractive indices, and explore their optical properties.

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