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JoVE 신문 공학
Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
DOI:

11:30 min

March 06, 2017

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Chapters

  • 00:05Title
  • 00:38Prepare for the Experiment
  • 01:41Couple the Free-space Laser into a Fiber
  • 02:41Measure Cavity Loss Factor and Mount the Sample
  • 03:51Cavity Sensitivity Calibration
  • 05:10Determine the Optimal Measurement Parameters
  • 07:17Measure the Time-resolved Microwave Conductivity Traces as a Function of Microwave Probe Frequency
  • 08:01Intensity Dependent Data Suite
  • 09:00Results: Time-resolved Microwave Conductivity Characterization of Recombination Dynamics in CH3NH3PbI3
  • 10:29Conclusion

Summary

자동 번역

A Time Resolved Microwave Conductivity technique for investigating direct and trap-mediated recombination dynamics and determining carrier mobilities of thin film semiconductors is presented here.

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