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Chapters
- 00:04Title
- 00:51Sample Fixation and Processing for Electron Microscopy
- 03:51Prepare Embedded Samples for Imaging
- 05:03Imaging in the SBF-SEM (Serial Block Face Scanning Electron Microscopy) and Data Processing
- 06:22Imaging in the FIB-SEM (Focused Ion Beam SEM)
- 07:49Results: SBF-SEM and FIB-SEM Data
- 08:46Conclusion
