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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
JoVE 신문
공학
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JoVE 신문 공학
Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
DOI:

08:58 min

December 02, 2022

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Chapters

  • 00:05Introduction
  • 00:58Sample Preparation and Instrument Setup
  • 02:05Probe Calibration
  • 04:15Collecting Force-Displacement (F-D) Data
  • 05:58F-D Curve Analysis
  • 06:44Results: Recent Advances in Atomic Force Microscopy for Surface Property Studies
  • 08:07Conclusion

Summary

자동 번역

Quantifying the contact area and force applied by an atomic force microscope (AFM) probe tip to a sample surface enables nanoscale mechanical property determination. Best practices to implement AFM cantilever-based nanoindentation in air or fluid on soft and hard samples to measure elastic modulus or other nanomechanical properties are discussed.

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