JoVE Journal (Engineering)
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Dec 5th, 2015 - Jun 27th, 2024
From:
Until:
Until:
![](/img/search-ajax-loader.gif)
Loading, please wait…
Cumulative Pageviews
![](/img/search-ajax-loader.gif)
Loading, please wait…
Top Institutions
Rank
Institution
Views
Rank
Institution
Views