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Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
JoVE Journal
Neurociência
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JoVE Journal Neurociência
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

DOI:
10.3791/2588-v

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08:57 min

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July 06, 2011

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, ,
1Centre of interdisciplinary electron microscopy,École Polytechnique Fédérale de Lausanne

Capítulos

  • 00:05Título
  • 01:29Sample Fixation and Resin Embedding
  • 04:00Preparing the Sample for the FIB/SEM
  • 05:55Imaging the FIB/SEM
  • 08:03Results: FIB/SEM Images of Brain Tissue
  • 08:40Conclusion

Summary

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This protocol describes how resin embedded brain tissue can be prepared and imaged in the three dimensions in the focussed ion beam, scanning electron microscope.

Tags

Focussed Ion Beam MillingScanning Electron MicroscopyFIB/SEM ProtocolAldehydes FixationHeavy Metal StainingOsmium TetroxideUranyl AcetateDehydrationResin InfiltrationUltramicrotomeGlass KnivesBlock PreparationVertical Face MillingBackscattered Electron ImagingSerial ImagingIsotropic VoxelsCell Ultrastructure Analysis

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