É necessária uma assinatura da JoVE para visualizar este conteúdo. Faça login ou comece sua avaliação gratuita.
Capítulos
- 00:05Título
- 01:17Preparing Glass Slides for Mounting Samples
- 02:06Dissecting and Mounting Samples
- 04:54AFM Preparation and Sensitivity Calibration
- 06:44Data Acquisition: Apparent Young’s Modulus Cartography
- 07:49Data Analysis: Apparent Young’s Modulus Calculations
- 08:42Results: Mechanical Properties of Plant Tissues Measured by AFM Micro/Nano-indentations
- 10:06Conclusion
We describe a method to map mechanical properties of plant tissues using an atomic force microscope (AFM). We focus on how to record mechanical changes that take place in cell walls during plant development at wide-field mesoscale, enabling these changes to be correlated with growth and morphogenesis.
