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Capítulos
- 00:05Título
- 02:13Mounting of COOH-SAM Surfaces on Gold for Soft Landing of Mass-selected Ions
- 03:07Soft Landing of Mass-selected Ru(bpy)32+ onto COOH-SAM Surfaces
- 04:17Analysis by In Situ TOF-SIMS Before and After Exposure to Reactive Gases
- 05:59Analysis by In Situ FT-ICR-SIMS and IRRAS During and After Soft Landing
- 07:28Results: Characterization of Organometallic Ions Soft Landed onto COOH-SAMs by In Situ SIMS and IR Spectroscopy
- 09:39Conclusion
Tags
Keywords: Soft LandingMass-selected IonsIn Situ CharacterizationSecondary Ion Mass Spectrometry (SIMS)Infrared Reflection Absorption Spectroscopy (IRRAS)OrganometallicsSelf-assembled MonolayersRuthenium Tris(bipyridine) DicationsTime-of-flight (TOF)-SIMSFourier Transform Ion Cyclotron Resonance (FT-ICR)-SIMS
