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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

DOI:
10.3791/53025-v

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10:39 min

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October 11, 2016

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, , , ,
1X-ray Science Division, Advanced Photon Source,Argonne National Laboratory, 2Division of Science,Diamond Light Source Ltd.

Capítulos

  • 00:05Título
  • 00:41Preparation of the 2-D Checkerboard Phase Grating
  • 04:43Experiment Setup and Alignment at the Synchrotron Facility
  • 06:17Performing Coherence Measurements
  • 08:19Results: Representative Data Measured Using 18 keV X-rays at 1-BM-B Experiment Hutch of Advanced Photon Source
  • 09:59Conclusion

Summary

Tadução automática

Tadução automática

The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray optics.

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Keywords: X-ray Beam Coherence2-D Checkerboard Phase GratingSynchrotron BeamlineGrading InterferometryTransverse Coherence2D GradientsElectroplating MoldSilicon WaferSilicon NitrideChromiumGoldPMMA ResistElectron Beam LithographyIsopropyl AlcoholDeveloper

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