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基于免疫荧光显微镜的瞬时和持久双链 dna 损伤 dna 修复过程的表征

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Characterizing DNA Repair Processes at Transient and Long-lasting Double-strand DNA Breaks by Immunofluorescence Microscopy

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基于免疫荧光显微镜的瞬时和持久双链 dna 损伤 dna 修复过程的表征

DOI:

10.3791/57653-v

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08:31 min

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June 08, 2018

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Vaibhav Murthy*¹, Dalton Dacus*¹, Monica Gamez, Changkun Hu, Sebastian O. Wendel, Jazmine Snow, Andrew Kahn, Stephen H. Walterhouse, Nicholas A. Wallace

¹Division of Biology,Kansas State University, ²Bristol Medical School, Translational Health Sciences,University of Bristol

Capítulos

00:40Defining the Kinetics of DSB Repair Complex Formation
03:38Defining Nuclei in Immunofluorescence Images
05:44Analyzing Localization to a Long-lasting Double-strand DNA Break
06:40Results: Co-localization of Double-strand DNA Breaks and Repair Proteins by Immunofluorescence Microscopy
07:46Conclusion

Summary

Tadução automática

双链 DNA 断裂的修复是一个动态过程, 不仅需要在断裂时形成修复配合物, 而且要解决病变后的解决方法。在这里, 我们使用免疫荧光显微镜的短暂和长期的双滞留断裂作为一个工具来解剖这个基因组维持机制。

Tags

Keywords: DNA Repair Double-strand DNA Breaks Immunofluorescence Microscopy DNA Repair Complex U2OS/DR-GFP Cells EDTA Trypsin DMEM Hydrogen Peroxide PBS PFA Non-ionic Detergent BSA Primary Antibodies DAPI

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