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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
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JoVE Journal Engenharia
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

DOI:
10.3791/60001-v

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00:10 min

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August 20, 2019

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, , , , , ,
1Deutsches Elektronen-Synchrotron, 2School of Electrical, Computer and Energy Engineering,Arizona State University, 3Department Physik,Universität Hamburg

Capítulos

  • 00:04Título
  • 01:12Measurement Environment Set-up
  • 03:07Pre-amplifier Setup
  • 04:13Lock-in Amplifier Setup
  • 05:36XBIC Measurements
  • 06:54Results: Lock-in Amplification Improves XBIC Measurements
  • 08:48Conclusion

Summary

Tadução automática

Tadução automática

A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.

Tags

Keywords: X-ray Beam Induced Current (XBIC)Multi-modal X-ray MicroscopySolar CellsCharge Collection EfficiencySemiconductor DevicesSample HolderPrinted Circuit BoardSpatial ResolutionGroundingBeam Footprint

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