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Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing
 

Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing

Article DOI: 10.3791/51094-v • 15:59 min • December 3rd, 2013
December 3rd, 2013 •
1, 1, 1, 1, 1, 1, 2, 2, 2, 1
1Department of Physics and Atmospheric Science, Dalhousie University, 2Department of Physics, University of Notre Dame

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Summary
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The technique of femtosecond four-wave mixing is described, including spectrally-resolved and time-resolved configurations. We illustrate the utility of this technique for the investigation of crucial physical properties in the III-V diluted magnetic semiconductors, afforded by its nonlinearity and high temporal resolution.

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Keywords: Femtosecond Four-wave Mixing Diluted Magnetic Semiconductors GaMnAs (s,p)-d Hybridization Spin-flip Scattering Time-resolved Spectroscopy Coherence Decay Semiconductor Systems Next-generation Electronics Optoelectronics
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