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Quantitative Hardness Measurement by Instrumented AFM-indentation
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JoVE Journal Engineering
Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

DOI:
10.3791/54706-v

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08:21 min

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November 22, 2016

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1School of Energy, Materials and Chemical Engineering,KoreaTech, Korea University of Technology and Education

Chapters

  • 00:05Title
  • 00:34AFM Instrument Set-up and Calibration
  • 02:47Quantitative Hardness Measurement Procedure
  • 06:24Results: Calculation of the Projected Area of an AFM Indent on an Atomically Smooth Gold Thin-film Surface
  • 07:29Conclusion

Summary

Automatic Translation

Automatic Translation

This experimental protocol describes how atomic force microscopy can be used to measure hardness at the true nanometer scale and to detect single atomistic plasticity events.

Tags

Keywords: AFM IndentationNano HardnessGold Thin FilmNano MechanicsPlastic DeformationHigh Spatial ResolutionDiamond Coated CantileverFrequency SweepPhotodiode SensitivityNon-compliant Reference SurfaceForce SpectroscopyCalibrationSample HolderOscillation FrequencyOscillation AmplitudeOscillation Set Point

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