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Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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Chemistry
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JoVE Journal Chemistry
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis

DOI:
10.3791/61758-v

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06:24 min

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September 13, 2020

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, , , , , , ,
1Division of Surface Analysis and Interfacial Chemistry,Federal Institute for Material Research and Testing (BAM), 2Department of Chemical and Product Safety,German Federal Institute for Risk Assessment (BfR)

Chapters

  • 00:05Introduction
  • 00:45Nanoparticle Suspension Preparation, Drop-Dry Deposition, and Spin Coating Deposition
  • 02:24Nanoparticle Powder Deposition
  • 03:15Nanoparticle Suspension Cryofixation
  • 04:06Results: Representative Nanoparticle Preparation for Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS) Analysis
  • 05:41Conclusion

Summary

Automatic Translation

Automatic Translation

A number of different procedures for preparing nanoparticles for surface analysis are presented (drop casting, spin coating, deposition from powders, and cryofixation). We discuss the challenges, opportunities, and possible applications of each method, particularly regarding the changes in the surface properties caused by the different preparation methods.

Tags

Keywords: NanoparticlesSurface AnalysisToF-SIMSXPSSample PreparationSuspensionDrop Dry MethodSpin CoatingPowder DepositionUV Ozone CleanerVacuumSilicon WaferO-ringMicroscopySEM

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