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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Chemistry
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JoVE Journal Chemistry
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

DOI:
10.3791/62015-v

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07:24 min

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May 10, 2021

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,
1Electron Nanoscopy Division, Advanced Measurement Technology Center, Institute of Materials & Systems for Sustainability,Nagoya University

Chapters

  • 00:04Introduction
  • 00:59Transmission Electron Microscopy (TEM) Alignment for Beam-Rocking
  • 02:36Incident Beam Collimation and Pivot Point Setup
  • 03:47Electron-Channeling Pattern (ECP) Acquisition
  • 04:30Energy-Dispersive X-Ray Analysis
  • 05:10Results: Representative ECP and ICP Emission Imaging
  • 06:46Conclusion

Summary

Automatic Translation

Automatic Translation

We provide a general outline of quantitative microanalysis methods for estimating the site occupancies of impurities and their chemical states by taking advantage of electron-channeling phenomena under incident electron beam-rocking conditions, which reliably extract information from minority species, light elements, oxygen vacancies, and other point/line/planar defects.

Tags

Quantitative AnalysisAtomic-siteFunctional DopantsPoint DefectsCrystalline MaterialsElectron-channeling-enhanced MicroanalysisEnergy-dispersive X-ray SpectroscopyElectron Energy-loss SpectroscopyLattice DefectsVacanciesInterstitialsGrain BoundariesTransmission Electron MicroscopySTEMOptical Axis AlignmentBeam RockingCaustic SpotCondenser Aperture

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