Curt A. Richter Engineering Physics Division National Institute of Standards and Technology Biography Publications Institution JoVE Articles Curt A. Richter has not added a biography. If you are Curt A. Richter and would like to personalize this page please email our Author Liaison for assistance. Publications Redox-Active Molecular Nanowire Flash Memory for High-Endurance and High-Density Nonvolatile Memory Applications ACS Applied Materials & Interfaces. Dec, 2015 | Pubmed ID: 26600234 Influence of Metal-MoS2 Interface on MoS2 Transistor Performance: Comparison of Ag and Ti Contacts ACS Applied Materials & Interfaces. Jan, 2015 | Pubmed ID: 25514512 Attachment of a Diruthenium Compound to Au and SiO2/Si Surfaces by "click" Chemistry Langmuir : the ACS Journal of Surfaces and Colloids. Sep, 2014 | Pubmed ID: 25110126 Interface Engineering to Control Magnetic Field Effects of Organic-based Devices by Using a Molecular Self-assembled Monolayer ACS Nano. Jul, 2014 | Pubmed ID: 24968019 Self-assembled Nanowire Array Capacitors: Capacitance and Interface State Profile Nanotechnology. Apr, 2014 | Pubmed ID: 24584362 Electrical and Physical Characterization of Bilayer Carboxylic Acid-functionalized Molecular Layers Langmuir : the ACS Journal of Surfaces and Colloids. Feb, 2013 | Pubmed ID: 23362920 Direct Measurement of Dirac Point Energy at the Graphene/oxide Interface Nano Letters. Jan, 2013 | Pubmed ID: 23244683 Toward Clean and Crackless Transfer of Graphene ACS Nano. Nov, 2011 | Pubmed ID: 21999646 Fabrication, Characterization and Simulation of High Performance Si Nanowire-based Non-volatile Memory Cells Nanotechnology. Jun, 2011 | Pubmed ID: 21572210 The Large-scale Integration of High-performance Silicon Nanowire Field Effect Transistors Nanotechnology. Oct, 2009 | Pubmed ID: 19755723 Formation of Silicon-based Molecular Electronic Structures Using Flip-chip Lamination Journal of the American Chemical Society. Sep, 2009 | Pubmed ID: 19670858 Noise in ZnO Nanowire Field Effect Transistors Journal of Nanoscience and Nanotechnology. Feb, 2009 | Pubmed ID: 19441450 Magnetic Tunnel Junctions with Self-assembled Molecules Journal of Nanoscience and Nanotechnology. Feb, 2009 | Pubmed ID: 19441442 Molecule-induced Interface States Dominate Charge Transport in Si-alkyl-metal Junctions Journal of Physics. Condensed Matter : an Institute of Physics Journal. Sep, 2008 | Pubmed ID: 21694421 Demonstration of Molecular Assembly on Si (100) for CMOS-compatible Molecule-based Electronic Devices Journal of the American Chemical Society. Apr, 2008 | Pubmed ID: 18324818 Probing Molecules in Integrated Silicon-molecule-metal Junctions by Inelastic Tunneling Spectroscopy Nano Letters. Feb, 2008 | Pubmed ID: 18189437 Electrical and Spectroscopic Characterization of Metal/monolayer/Si Devices The Journal of Physical Chemistry. B. Nov, 2005 | Pubmed ID: 16853836 Enhanced Channel Modulation in Dual-gated Silicon Nanowire Transistors Nano Letters. Dec, 2005 | Pubmed ID: 16351207 Influence of a Water Rinse on the Structure and Properties of Poly(3,4-ethylene Dioxythiophene):poly(styrene Sulfonate) Films Langmuir : the ACS Journal of Surfaces and Colloids. Nov, 2005 | Pubmed ID: 16285829 Comparison of Si-O-C Interfacial Bonding of Alcohols and Aldehydes on Si(111) Formed from Dilute Solution with Ultraviolet Irradiation Langmuir : the ACS Journal of Surfaces and Colloids. Feb, 2005 | Pubmed ID: 15667163 Structural and Chemical Characterization of Monofluoro-substituted Oligo(phenylene-ethynylene) Thiolate Self-assembled Monolayers on Gold Langmuir : the ACS Journal of Surfaces and Colloids. Jul, 2004 | Pubmed ID: 15248703 שיטות ניסיוניות מתקדמות לטמפרטורה נמוכה Magnetotransport מדידה של חומרים חדשים Joseph A. Hagmann1, Son T. Le1, Curt A. Richter1, David G. Seiler1 1Engineering Physics Division, National Institute of Standards and Technology Engineering
שיטות ניסיוניות מתקדמות לטמפרטורה נמוכה Magnetotransport מדידה של חומרים חדשים Joseph A. Hagmann1, Son T. Le1, Curt A. Richter1, David G. Seiler1 1Engineering Physics Division, National Institute of Standards and Technology Engineering