Ivo W. Rangelow Nanoscale Systems Group, Institute of Process Measurement and Sensor Technology Ilmenau University of Technology Biography Publications Institution JoVE Articles Ivo W. Rangelow has not added a biography. If you are Ivo W. Rangelow and would like to personalize this page please email our Author Liaison for assistance. Publications Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing Sensors (Basel, Switzerland). Oct, 2019 | Pubmed ID: 31614863 Charged Particle Single Nanometre Manufacturing Beilstein Journal of Nanotechnology. 2018 | Pubmed ID: 30498657 Atomic Layer Deposition for Spacer Defined Double Patterning of Sub-10 Nm Titanium Dioxide Features Nanotechnology. Oct, 2018 | Pubmed ID: 30010091 Fabrication Process for an Optomechanical Transducer Platform with Integrated Actuation Journal of Research of the National Institute of Standards and Technology. 2016 | Pubmed ID: 34434639 Low Temperature Dry Etching of Chromium Towards Control at Sub-5 Nm Dimensions Nanotechnology. Oct, 2016 | Pubmed ID: 27606715 Multi-eigenmode Control for High Material Contrast in Bimodal and Higher Harmonic Atomic Force Microscopy Nanotechnology. Jun, 2015 | Pubmed ID: 25994333 Adaptive AFM Scan Speed Control for High Aspect Ratio Fast Structure Tracking The Review of Scientific Instruments. Oct, 2014 | Pubmed ID: 25362402 Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays Fangzhou Xia1, Kamal Youcef-Toumi1, Thomas Sattel2, Eberhard Manske3, Ivo W. Rangelow4,5 1Mechatronics Research Lab, Department of Mechanical Engineering, Massachusetts Institute of Technology, 2Mechatronics Group, Department of Mechanical Engineering, Ilmenau University of Technology, 3Production and Precision Measurement Technology Group, Institute of Process Measurement and Sensor Technology, Ilmenau University of Technology, 4Nanoscale Systems Group, Institute of Process Measurement and Sensor Technology, Ilmenau University of Technology, 5nano analytik GmbH JoVE 65210 Engineering
Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays Fangzhou Xia1, Kamal Youcef-Toumi1, Thomas Sattel2, Eberhard Manske3, Ivo W. Rangelow4,5 1Mechatronics Research Lab, Department of Mechanical Engineering, Massachusetts Institute of Technology, 2Mechatronics Group, Department of Mechanical Engineering, Ilmenau University of Technology, 3Production and Precision Measurement Technology Group, Institute of Process Measurement and Sensor Technology, Ilmenau University of Technology, 4Nanoscale Systems Group, Institute of Process Measurement and Sensor Technology, Ilmenau University of Technology, 5nano analytik GmbH JoVE 65210 Engineering