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Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
 

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

Article DOI: 10.3791/55232-v • 11:30 min • March 6th, 2017
March 6th, 2017 •
1,2, 3, 4, 1,2
1ARC Centre of Excellence in Exciton Science, 2School of Physics, University of New South Wales, 3CSIRO, CSIRO Energy Centre, 4School of Chemistry, University of New South Wales

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résumé
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A Time Resolved Microwave Conductivity technique for investigating direct and trap-mediated recombination dynamics and determining carrier mobilities of thin film semiconductors is presented here.

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Recombination Dynamics Thin-film Photovoltaic Materials Time-resolved Microwave Conductivity Photo-induced Charge Carriers Trap States Band-to-band Recombination Processes Reflected Microwave Power Electrical Contacts Measured Lifetimes Conductivities Cathodes Measurement Sample Thin-film Perovskite Sample Microwave Cavity Network Analyzer Laser Custom Microwave Cavity Quarter-wave Plates Iris Fiber Port Teflon Sample Holder Defuser Tuning Screw Off-axis Parabolic Mirror Coupler Neutral-density Filters
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