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量子干涉效应在硅谐振环光子源测量

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Ingénierie

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Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

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量子干涉效应在硅谐振环光子源测量

DOI:

10.3791/55257-v

•

12:19 min

•

April 04, 2017

•

Jeffrey A. Steidle, Michael L. Fanto², Stefan F. Preble, Christopher C. Tison^3,4, Gregory A. Howland, Zihao Wang, Paul M. Alsing

¹Microsystems Engineering,Rochester Institute of Technology, ²Air Force Research Laboratory, Rome, NY, ³Department of Physics,Florida Atlantic University, ⁴Quanterion Solutions Incorporated

Chapitres

00:05Titre
00:34Photonic Chip Preparation
02:24Preparation of Fiber Pigtails
03:45Configuration of the Photonic Chip and Fibers
06:09Dispersion Characterization
08:42Measuring Two-photon Interference
10:25Results: Interference and Bi-photon Visibility Measurement
11:32Conclusion

Summary

Traduction automatique

硅光子芯片必须认识到复杂的集成量子系统的潜力。这里介绍的是用于制备和测试对于量子测量硅光子芯片的方法。

Tags

Keywords: Quantum Interference Silicon Ring Resonator Photon Source Integrated Photonics Chip-scale Photon Pair Source Quantum Integrated Photonic Circuits Photonic Chip Pump Circuit Ring Resonator Mach-Zehnder Interferometer On-chip Heating Phase Shift Chip Polishing Fiber Preparation Fiber Stripper Fiber Cleaver Fusion Splicer Sleeve Oven

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