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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
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Chapitres
- 00:04Titre
- 01:12Measurement Environment Set-up
- 03:07Pre-amplifier Setup
- 04:13Lock-in Amplifier Setup
- 05:36XBIC Measurements
- 06:54Results: Lock-in Amplification Improves XBIC Measurements
- 08:48Conclusion
A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.
