Dose Calibration of the Transmission Electron Microscope for TEM and Scanning TEM (STEM) Imaging Modes Using a Machine-Vision Approach

マシンビジョンアプローチを使用したTEMおよび走査型TEM(STEM)イメージングモード用の透過型電子顕微鏡の線量校正

Published: June 23, 2023

doi:

10.3791/200190

Madeline Dressel Dukes, Nynke Albertine Krans, Katherine Marusak, Stamp Walden, Tim Eldred, Alan Franks, Ben Larson, Yaofeng Guo, David Nackashi, John Damiano

¹Protochips, Inc.

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Dose Calibration of the Transmission Electron Microscope for TEM and Scanning TEM (STEM) Imaging Modes Using a Machine-Vision Approach. J. Vis. Exp. (Pending Publication), e200190, doi:10.3791/200190 (2023).

マシンビジョンアプローチを使用したTEMおよび走査型TEM(STEM)イメージングモード用の透過型電子顕微鏡の線量校正

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マシンビジョンアプローチを使用したTEMおよび走査型TEM(STEM)イメージングモード用の透過型電子顕微鏡の線量校正

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