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JoVE Journal Engineering
Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model
 

Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model

Article DOI: 10.3791/53026-v • 06:54 min • August 22nd, 2015
August 22nd, 2015 •
1, 1,2
1Department of Applied Physics, Eindhoven University of Technology, 2Dutch Institute for Fundamental Energy Research

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We demonstrate how to determine the size distribution of semiconductor nanocrystals in a quantitative manner using Raman spectroscopy employing an analytically defined multi-particle phonon confinement model. Results obtained are in excellent agreement with the other size analysis techniques like transmission electron microscopy and photoluminescence spectroscopy.

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Keywords: Nanocrystal Size Distribution Raman Spectroscopy Multi-particle Phonon Confinement Model Semiconductor Nanocrystals Size-dependent Phonon Confinement Non-destructive Size Analysis Silicon Nanocrystals Transmission Electron Microscopy X-ray Diffraction Photoluminescence Spectroscopy
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