Waiting
Elaborazione accesso...

Trial ends in Request Full Access Tell Your Colleague About Jove
Journal / Engineering / Applying X-ray Imaging Crystal Spectroscopy for…
JoVE Journal
Engineering

È necessario avere un abbonamento a JoVE per visualizzare questo Contenuto. Accedi o inizia la tua prova gratuita.

JoVE Journal Engineering
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
 

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Article DOI: 10.3791/54408-v • 06:46 min • August 25th, 2016
August 25th, 2016 •
1, 2, 3
1Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 2Department of Physics, Massachusetts Institute of Technology, 3Plasma Science and Fusion Center, Massachusetts Institute of Technology

Capitoli

Riepilogo
Automatic Translation

X-ray spectra provide a wealth of information on high temperature plasmas. This manuscript presents the operation of a high wavelength resolution spatially imaging X-ray spectrometer used to view hydrogen- and helium-like ions of medium atomic number elements in a tokamak plasma.

Tags

Keywords: X-ray Imaging Crystal Spectroscopy Plasma Diagnostics Fusion Plasma Ion Temperature Rotation Velocity Electron Temperature Impurity Density Transport Modeling HIREXSR Laser Blow-off Tokamak Plasma
Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter