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Kvantificere X-Ray fluorescens Data ved hjælp af kort
 
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Kvantificere X-Ray fluorescens Data ved hjælp af kort

Article DOI: 10.3791/56042-v 14:59 min February 17th, 2018
February 17th, 2018

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Her viser vi brugen af X-ray fluorescens montering software, kort, lavet af Argonne National Laboratory for kvantitativ bestemmelse af Fluorescens mikroskopi data. De kvantitative data, at resultaterne er nyttige for at forstå elementært distribution og støkiometriske forhold inden for en prøve af interesse.

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Kemi sag 132 X-ray fluorescens kvantificering synchrotron montering solcelle defekter urenheder software kort
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