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神经科学中透射电镜切片采样的一种无偏方法
JoVE Journal
Neuroscienze
This content is Free Access.
JoVE Journal Neuroscienze
An Unbiased Approach of Sampling TEM Sections in Neuroscience
DOI:

10:56 min

April 13, 2019

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Capitoli

  • 00:04Titolo
  • 01:02TEM Preparation Embedding, Ultra-Thin Sectioning and Staining
  • 02:05Imaging of Corresponding ROIs on the Reference and Look-Up Sections on TEM with Software Packages
  • 05:25Analyze the TEM images with ImageJ to Document Ultrastructural Features
  • 07:10Using SerialEM Script to Optimize Elemental Analysis in Brain Samples in Combination with DigitalMicrograph
  • 09:19Results: Unbiased Approach of Sampling TEM Sections
  • 10:25Conclusion

Summary

Traduzione automatica

我们介绍了一种新的脑组织电子显微镜研究工作流程。该方法允许用户以无偏见的方式检查神经元特征。对于元素分析, 我们还提供了一个脚本, 该脚本自动化了随机采样的大部分工作流。

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