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Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
 

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains

Article DOI: 10.3791/64180-v • 07:42 min • July 20th, 2022
July 20th, 2022 •
*1, *1, 2, 2, 1,3
1Micron School of Materials Science & Engineering, Boise State University, 2Department of Physics and Astronomy, University of Delaware, 3Center for Advanced Energy Studies
* These authors contributed equally

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Magnetic force microscopy (MFM) employs a vertically magnetized atomic force microscopy probe to measure sample topography and local magnetic field strength with nanoscale resolution. Optimizing MFM spatial resolution and sensitivity requires balancing decreasing lift height against increasing drive (oscillation) amplitude, and benefits from operating in an inert atmosphere glovebox.

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Keywords: Magnetic Force Microscopy MFM Nanoscale Magnetic Domains Spin-wave Computing Artificial Spin Ices Magnetization Textures High-resolution MFM AFM Probe Magnetic Coating Vertically Magnetized Laser Alignment Position-sensitive Detector Sample Holder
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