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表面附近的高速粒子图像测速

JoVE 신문
공학

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JoVE 신문 공학

High-speed Particle Image Velocimetry Near Surfaces

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表面附近的高速粒子图像测速

DOI:

10.3791/50559-v

•

11:59 min

•

June 24, 2013

•

Louise Lu, Volker Sick

¹Department of Mechanical Engineering,University of Michigan

Chapters

00:05Title
01:24Preparation and Set-up
02:35Optimizing the Set-up
04:30Running the Experiment
06:53Data Processing
09:57Results: Transient Flow Near the Surface of a Flat Plate
11:25Conclusion

Summary

자동 번역

研究瞬变流边界附近，使用高分辨率，高速粒子图像测速（PIV）的一个过程。 PIV是一种非侵入式测量技术适用于任何光学访问的流量通过优化多个参数的限制，例如图像和记录性能，激光表属性，和分析算法。

Tags

Particle Image Velocimetry High-speed PIV Transient Flow Measurement Multi-dimensional Flow Laser-based Imaging Flow Visualization Surface Flow Flow Analysis

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