JoVE Journal
Engineering
Engineering
이 콘텐츠 오픈 액세스로 구독없이 시청하실 수 있습니다.
챕터
요약
A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.