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Atomic Force Microscopy Cantilever-Based Nanoindentation
 

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Article DOI: 10.3791/64497-v 08:58 min December 2nd, 2022
December 2nd, 2022

챕터

요약

Quantifying the contact area and force applied by an atomic force microscope (AFM) probe tip to a sample surface enables nanoscale mechanical property determination. Best practices to implement AFM cantilever-based nanoindentation in air or fluid on soft and hard samples to measure elastic modulus or other nanomechanical properties are discussed.

Tags

Keywords: Atomic Force Microscopy AFM Cantilever-based Nanoindentation Nanoscale Mechanical Properties Modulus Air Fluid Topographical Imaging Quantitative Measurements Calibration Probe Force Displacement Deflection Sensitivity
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