JoVE Journal
Engineering
Engineering
É necessário ter uma assinatura JoVE para assistir este Faça login ou comece sua avaliação gratuita.
Capítulos
Resumo
Cryogenic Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) techniques can provide key insights into the chemistry and morphology of intact solid-liquid interfaces. Methods for preparing high quality Energy Dispersive X-ray (EDX) spectroscopic maps of such interfaces are detailed, with a focus on energy storage devices.